#3324 Extend waiting time in test_attr_access_sd Pull request opened by BarryWu0812 ## Tracking issue ## Why are the changes needed? Recently, the integration test often fail at test_attr_access_sd with user runtime error. Thus, just extending the waiting time to test whether the integration test pass easily. ## What changes were proposed in this pull request? Extend the waiting time. ## How was this patch tested? ### Setup process ### Screenshots ## Check all the applicable boxes • I updated the documentation accordingly. • All new and existing tests passed. • All commits are signed-off. ## Related PRs ## Docs link https://bito.ai#summarystart| ### Summary by Bito This pull request extends the waiting time in the integration test for the

test_attr_access_sd

function to reduce frequent test failures caused by user runtime errors. The adjustment aims to enhance the reliability of the integration tests. flyteorg/flytekit